JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Surplus Removed from a TEL Tokyo

Removed from a TEL Tokyo Electron P-8 Fully Automatic Wafer Prober System Installed Components

Part No: 17021871

Inventory # A-13508

Nikon Part No: 4S001-106-1

JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Surplus Removed from a TEL TokyoJEOL SIP Control SIP BAKEOUT Power Supply JWS 7555S Wafer Defect SEM Surplus Inventory # CONF 1167 Part No: SIP CONTROL Model No: SIP BAKEOUT POWER SUPPLY Removed from a JEOL JWS 7555S Wafer Defect Review SEM Scanning Electron Microscope System This JEOL SIP Control SIP BAKEOUT Power Supply JWS 7555S Wafer Defect SEM is used working surplus. The unit has cut cables (see photos). The physical condition is good, but there are signs of previous use and