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G03800 - SEMI G38 - 静止空気および強制風冷によるICパッケージのジャンクション部周囲間の熱抵抗の測定法 StdPbc-0720 This proposal uses these methods
G03800 - SEMI G38 - 静止空気および強制風冷によるICパッケージのジャンクション部周囲間の熱抵抗の測定法 StdPbc-0720 This proposal uses these methods
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Description
This proposal uses these methods to describe data structures for crystalline and thin film equipment
to be published February 1999
SEMI D50-0707 (first published)
it is intended that the concepts of terms which should be used at the technical conferences
G03800 - SEMI G38 - 静止空気および強制風冷によるICパッケージのジャンクション部周囲間の熱抵抗の測定法 StdPbc-0720 This proposal uses these methodsglobal Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org1987200411 : IC Referenced SEMI Standards SEMI G32 Guideline for Unencapsulated Thermal Test Chip SEMI G42 Specification for Thermal Test Board Standardization for Measuring Junction to Ambient Thermal Resistance of Semiconductor Packages
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