Historical Worldwide Semiconductor Equipment Market Statistics (WWSEMS) Report (1991-2025) StdPbc-0309 This Standard specifies the test

This Standard specifies the test method to compare and evaluate the scratch resistance for the surface of FPD polarizing film and cover plastics for mobile displays

and mean work between failures (MWBF)

Immunity is specified in terms of voltage sag depth (in percent of nominal voltage remaining during the sag) and voltage sag duration (in cycles or seconds)

previously published July 2006

Historical Worldwide Semiconductor Equipment Market Statistics (WWSEMS) Report (1991-2025) StdPbc-0309 This Standard specifies the testThe WWSEMS report provides monthly historical data of the global equipment bookings for over 22 categories in North America, Japan, Europe, Korea, Taiwan, China and Rest of World (ROW). Japanese headquartered companies provide inputs through SEMIs partner, the Semiconductor Equipment Association of Japan (SEAJ). The billings data dates back to 1991 with the start of the WWSEMS data program at SEMI. Bookings data collection began in 1997 and ended in