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G00300 - SEMI G3 - 仕様 側面ろう付け積層板 Revision:SEMI G3-90 - Inactive SEMI MF1152-0305 (Reapproved 0211)

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SEMI MF1152-0305 (Reapproved 0211)

SEMI E114-0302E (Reapproved 0923)

SEMI G59 — Test Method for Measurement of Ionic Contamination on Leadframe Interleafing and the Contamination Transferred from the Interleafing to the Leadframes

orgで入手可能となる。初版は2011年6月発行。前版は2012年3月発行。

G00300 - SEMI G3 - 仕様 側面ろう付け積層板 Revision:SEMI G3-90 - Inactive SEMI MF1152-0305 (Reapproved 0211)CurrentInactiveInactiveSEMI 7. 62 mm (0. 003 in.)10. 16 mm (0. 400 in.)15. 24 mm (0. 600 in.)22. 86 mm (0. 900 in.) Referenced SEMI Standards None.

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