Flex Electronics Webinar Master Class: November 8 2023 - On Demand StdDcs-Inactive SEMI MF673 — Test Method

SEMI MF673 — Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy Current Gauge

it becomes possible to carry out data handling between design and wafer manufacture so that the data can be reused during recipe making of wafer exposure tools

2  This Test Method determines net carrier density and resistivity based on reverse-bias voltage dependence of the capacitance in a Schottky junction diode (hereinafter referred to as C-V method)

This introductory course

Flex Electronics Webinar Master Class: November 8 2023 - On Demand StdDcs-Inactive SEMI MF673 — Test Method