P02800 - SEMI P28 - 集積回路製造用オーバーレイ計測テストパターン StdPbc-0516 flip chip bumping

flip chip bumping

SEMI E84-0200 (technical revision)

It applies to PV Si wafers that are marked with one of the marks as described in SEMI PV29 and SEMI PV32

3D angular luminance uniformity

P02800 - SEMI P28 - 集積回路製造用オーバーレイ計測テストパターン StdPbc-0516 flip chip bumpingNOTICE: This translation is a REFERENCE COPY ONLY. If differences should exist between the English version and a translation in any other language, the English version is the official and authoritative version. SEMI SEMI global Micropatterning Committee2007425global Audits and Reviews Subcommittee20076www. semi. org1996 NOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met.