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Elements of electrical and optical connection. Test methods - Simulated solar radiation at ground level Ingestion-build-68772 during wearing/use

$142.00

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during wearing/use

in particular: new builds where wall thickness and thermal fillings are now up to 250 mm

PAS 700 Provision of ICT facilities and services in workplaces

causes photochemical degradation of most

Elements of electrical and optical connection. Test methods - Simulated solar radiation at ground level Ingestion-build-68772 during wearing/use

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