Integrated circuits. Measurement of electromagnetic immunity - Measurement of radiated immunity. Surface scan method Ingestion-build-51215 and the characterization of the

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Integrated circuits. Measurement of electromagnetic immunity - Measurement of radiated immunity. Surface scan method Ingestion-build-51215 and the characterization of the1 Scope This part of IEC 62132 provides a test procedure, which defines a method for evaluating the effect of near electric, magnetic or electromagnetic field components on an integrated circuit (IC). This diagnostic procedure is intended for IC architectural analysis such as floor planning and power distribution optimization. This test procedure is applicable to testing an IC mounted on any circuit board that is accessible to the scanning probe. In