Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test Ingestion-build-258901 operating and maintaining the equipment

operating and maintaining the equipment in the manner prescribed by the manufacturer

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Tables where the structure is intended to support a parasol

BS EN 61076-4-115:2003 has been superseded by BS EN 61326-2-3:2013

Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test Ingestion-build-258901 operating and maintaining the equipment1 Scope This part of IEC 60749 provides a steady state temperature and humidity bias life test for the purpose of evaluating the reliability of non hermetic packaged solid state devices in humid environments. This test method is considered destructive.