Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level Ingestion-build-181247 BS EN 599-2 is used

BS EN 599-2 is used in conjunction with EN 599-1

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Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level Ingestion-build-181247 BS EN 599-2 is used1 Scope This part of IEC 60749 establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto electronic devices, hybrid integrated circuits (HICs), and