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Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Ingestion-build-143074 This International Standard defines requirements
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Ingestion-build-143074 This International Standard defines requirements
$166.00
Description
This International Standard defines requirements for a half-tone certified reference material which may be used for the opaque area percentage calibration of transmission densitometers or colorimeters for use in the graphic arts
Term entries are arranged
used in several areas of construction and frequently used in standards
liquefied natural gas (LNG) facilities and oil and gas production facilities
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Ingestion-build-143074 This International Standard defines requirements
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