Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-264231 Components and parts used in

Components and parts used in such systems should be clean prior to assembly

Developing and implementing a BCM response

BS EN 1303:2015 supersedes BS EN 1303:2005

they are decisive for the possible applications of the material

Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-264231 Components and parts used in1 Scope This PART of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.